LSI/VLSI testability design

LSI/VLSI testability design /

Saved in:
Bibliographic Details
Main Author: Tsui, Frank F.
Format: Book
Language:English
Published: New York : McGraw-Hill, [1987]
Subjects:
Integrated circuits > Large scale integration > Testing.
Integrated circuits > Very large scale integration > Testing.
Integrated circuits.

University Library ARS Main Stacks

Holdings details from University Library ARS Main Stacks
Call Number: TK7874 .T78 1987
Copy 1 Available Request this item

Similar Items