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b1649099 |
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20240627101530.0 |
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970514t19981998nyua b 001 0 eng |
| 010 |
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|a 97019691
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| 020 |
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|a 0780311736 (alk. paper)
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| 035 |
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|a (OCoLC)36961046
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| 040 |
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|a DLC
|c DLC
|d PMC
|d UtOrBLW
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| 049 |
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|a STAM
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| 050 |
0 |
0 |
|a TK7895.M4
|b N634 1998
|
| 245 |
0 |
0 |
|a Nonvolatile semiconductor memory technology :
|b a comprehensive guide to understanding and to using NVSM devices /
|c edited by William D. Brown, Joe E. Brewer.
|
| 264 |
|
1 |
|a New York :
|b IEEE Press,
|c [1998]
|
| 264 |
|
4 |
|c ©1998
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| 300 |
|
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|a xxiii, 589 pages :
|b illustrations ;
|c 26 cm.
|
| 336 |
|
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|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
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|a volume
|b nc
|2 rdacarrier
|
| 490 |
1 |
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|a IEEE Press series on microelectronic systems
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| 504 |
|
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|a Includes bibliographical references (pages 483-553) and index.
|
| 505 |
0 |
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|a Basics of nonvolatile semiconductor memory devices / G. Groeseneken ... [et al.] -- Floating gate planar devices / H.C. Lin and R. Ramaswami -- Floating gate nonplanar devices / H.A.R. Wegener and W. Owen -- Floating gate flash devices / M. Gill and S. Lai -- SONOS nonvolatile semiconductor memories / M.H. White and F.R. Libsch -- Reliability and NVSM reliability / Y. Hsia and V.C. Tyree -- Radiation tolerance / G. Messenger -- Procurement considerations / D. Sweetman.
|
| 650 |
|
0 |
|a Semiconductor storage devices.
|0 http://id.loc.gov/authorities/subjects/sh85119900
|
| 650 |
|
7 |
|a Semiconductor storage devices.
|2 fast
|0 (OCoLC)fst01112182
|
| 700 |
1 |
|
|a Brown, William D.,
|d 1943-
|0 http://id.loc.gov/authorities/names/n97051715
|
| 700 |
1 |
|
|a Brewer, Joe
|q (Joe E.)
|0 http://id.loc.gov/authorities/names/nr89004998
|
| 830 |
|
0 |
|a IEEE Press series on microelectronic systems.
|0 http://id.loc.gov/authorities/names/n97051729
|
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|a Santa Clara University
|b Santa Clara Main Campus
|c University Library
|d University Library Main Stacks, Lower Level
|t 0
|e TK7895.M4 N634 1998
|h Library of Congress classification
|i book
|m 35098107374111
|n c.1
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