Randomness testing of the advanced encryption standard finalist candidates /

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Bibliographic Details
Main Author: Soto, Juan, 1969-
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Bassham, Lawrence E.
Format: Government Document Microfilm Book
Language:English
Published: Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
Series:NISTIR ; 6483.
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University Library ARS Government Documents

Holdings details from University Library ARS Government Documents
Call Number: QA76.9.A25 S67
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