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Bibliographic Details
Corporate Authors: International Workshop on Defect and Fault Tolerance in VLSI Systems, IEEE Computer Society, IEEE Computer Society. Fault-Tolerant Computing Technical Committee
Format: Conference Proceeding
Language:English
Published: Los Alamitos, CA : IEEE Computer Society Press, 1989-
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Fault-tolerant computing > Congresses.
Integrated circuits > Very large scale integration > Design and construction.
Integrated circuits.
Fault-tolerant computing.
Conference papers and proceedings.

University Library ARS Main Stacks

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Call Number: TK7874 .D415
Copy 1 (1988) Available Request this item
Copy 2 (1991) Available Request this item

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