Characterization methods for submicron MOSFETs /
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| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
Boston :
Kluwer Academic Publishers,
[1995]
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| Series: | Kluwer international series in engineering and computer science ;
SECS 352. Kluwer international series in engineering and computer science. Analog circuits and signal processing. |
| Subjects: |
University Library ARS Main Stacks
| Call Number: |
TK7871.95 .C56 1995
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| Copy 1 | Available Request this item |