Materials reliability in microelectronics VII : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A.

Materials reliability in microelectronics VII : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A. /

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Bibliographic Details
Other Authors: Clement, J. Joseph
Format: Book
Language:English
Published: Pittsburgh, Pa. : Materials Research Society, [1997]
Series:Materials Research Society symposia proceedings ; v. 473.
Subjects:
Microelectronics > Reliability > Congresses.
Microelectronics > Materials > Testing > Congresses.
Microstructure > Congresses.
Metallizing > Congresses.
Microelectronics > Reliability.
Microelectronics.
Microelectronics > Materials > Testing.
Microstructure.
Metallizing.
Conference papers and proceedings.

University Library ARS Main Stacks

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Call Number: TK7874 .M3425 1997
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