Small angle scattering by dislocations /

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Bibliographic Details
Main Author: Thomson, Robb
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Levine, L. E., Long, G. G.
Format: Government Document Microfilm Book
Language:English
Published: Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, [1998]
Series:NISTIR ; 6117.
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University Library Government Documents - Microforms, 3rd Floor

Holdings details from University Library Government Documents - Microforms, 3rd Floor
Call Number: MICRO C 13.58:6117
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