Dielectric measurements using a reentrant cavity : mode-matching analysis

Dielectric measurements using a reentrant cavity : mode-matching analysis /

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Bibliographic Details
Main Author: Baker-Jarvis, James
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Riddle, Bill
Format: Government Document Microfilm Book
Language:English
Published: Boulder, Colo. : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, 1996.
Series:NIST technical note ; 1384.
Subjects:
Dielectric measurements.

University Library Government Documents - Microforms, 3rd Floor

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Call Number: MICRO C 13.46:1384
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