Fast probing considerations for on-machine inspection of parts

Fast probing considerations for on-machine inspection of parts /

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Bibliographic Details
Main Author: Ling, Alice V.
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Wilkin, Neil D.
Format: Government Document Microfilm Book
Language:English
Published: Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, [1999]
Series:NISTIR ; 6415.
Subjects:
Probes (Electronic instruments) > Calibration.
Machining > Computer programs.
Machine parts > Inspection.
Probes (Electronic instruments)
Machining.
Computer programs.
Machine parts.

University Library ARS Government Documents

Holdings details from University Library ARS Government Documents
Call Number: MICRO C 13.58:6415
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