Highly charged ions : publications of the EBIT Project, 1993-2001, Atomic Physics Division, NIST, Gaithersburg, Maryland

Highly charged ions : publications of the EBIT Project, 1993-2001, Atomic Physics Division, NIST, Gaithersburg, Maryland /

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Bibliographic Details
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Gillaspy, John
Format: Government Document Microfilm Book
Language:English
Published: Gaithersburg, MD : U.S. Department of Commerce, Technology Administration, National Institute of Standards and Technology, [2002]
Series:NIST special publication ; 972.
Subjects:
Physics Laboratory (U.S.). > Atomic Physics Division > Research.
Physics Laboratory (U.S.). > Atomic Physics Division.
Physics Laboratory (U.S.)
Trapped ions.
Electron beams.
Electron-ion collisions.
Ion bombardment.
Plasma radiation.
Research.

University Library Government Documents - Microforms, 3rd Floor

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Call Number: MICRO C 13.10:972
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