Testing embedded phase-locked loops and delay-locked loops

Testing embedded phase-locked loops and delay-locked loops /

Saved in:
Bibliographic Details
Main Author: Egan, Thomas Vincent
Format: Thesis Book
Language:English
Published: [Place of publication not identified] : [publisher not identified], 2005.
Subjects:
Phase-locked loops.

University Library ARS Main Stacks

Holdings details from University Library ARS Main Stacks
Call Number: TK7872.P38 E43 2005
Copy 1 ( c.2) Available Request this item

University Library Archives & Special Collections - SCU Theses, 3rd Floor

Holdings details from University Library Archives & Special Collections - SCU Theses, 3rd Floor
Call Number: TK7872.P38 E43 2005
Copy 1 Available Request this item
Notes:
  • Reading Room Use Only

Similar Items