CMOS Test and Evaluation : A Physical Perspective /
This book extends test structure applications described in Microelectronic Test Structures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and prod...
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| Main Authors: | , |
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
New York, NY :
Springer New York : Imprint: Springer,
2015.
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| Subjects: | |
| Online Access: | Connect to this title online |