Advanced Transmission Electron Microscopy : Imaging and Diffraction in Nanoscience

Advanced Transmission Electron Microscopy : Imaging and Diffraction in Nanoscience /

This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the application...

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Bibliographic Details
Main Authors: Zuo, Jian Min (Author), Spence, John C. H. (Author)
Format: Electronic eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2017.
Subjects:
Materials science.
Nanochemistry.
Nanoscience.
Nanostructures.
Nanotechnology.
Solid state physics.
Materials Science.
Characterization and Evaluation of Materials.
Nanoscale Science and Technology.
Optics, Lasers, Photonics, Optical Devices.
Solid State Physics.
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